5

An energy relaxation time model for device simulation

Year:
1999
Language:
english
File:
PDF, 141 KB
english, 1999
6

Ionized-Impurity Scattering of Majority Electrons in Silicon

Year:
1998
Language:
english
File:
PDF, 303 KB
english, 1998
24

Anomalous Piezoresistance Effect in Ultrastrained Silicon Nanowires

Year:
2010
Language:
english
File:
PDF, 2.32 MB
english, 2010
27

VSP – A gate stack analyzer

Year:
2007
Language:
english
File:
PDF, 176 KB
english, 2007
28

Wigner function approach to nano device simulation

Year:
2006
Language:
english
File:
PDF, 275 KB
english, 2006
41

Carrier concentration dependence of the mobility in organic semiconductors

Year:
2007
Language:
english
File:
PDF, 301 KB
english, 2007
46

A single-electron device and circuit simulator

Year:
1997
Language:
english
File:
PDF, 135 KB
english, 1997
49

An Improved Ionized Impurity Scattering Model for Monte Carlo Calculations

Year:
1998
Language:
english
File:
PDF, 1.48 MB
english, 1998